Due to the anticipated significant winter storm expected for the Akron area overnight and into tomorrow, all University of Akron campuses will be closed on Friday, Jan. 19.
X-Ray Diffraction (XRD) is a non-destructive analytical technique providing information about crystal structure, chemical composition and physical characteristics of materials and thin films
Applications: identification and quantification of the crystalline phase, thin film thickness measurements, corrosion, nanomaterials, powders, materials for tribological control, biomaterials, thin polymer films, thin film multilayers, patterned films
